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EllipsoStep™ Lab Systems

Imaging Spectroscopic Ellipsometer

EllipsoStep measures the refractive index (n and k) and thin-film thickness at every location in an image. Ideal for measuring areas too small for single-point ellipsometers or when 1D line scans or 2D maps of thickness, n or k are needed.

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We offer measurement solutions for nearly every polarization-critical application, from R&D to Quality Control to Production. Contact us to discuss your applications.

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